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NAND Flash Memory Tester SigNAS3

NAND Flash Memory Tester SigNAS3

2010年9月に発売を開始したSigNAS2を多くのお客さまにご愛用いただく中で、たくさんのご要望をいただきました。その中でも特に多かったのが「受入検査用に大量のNANDフラッシュメモリを一度に試験したい」というものでした。

NAND Flash Memory Tester SigNAS3

Developed from the base of SigNASII and with the same analysis functionality, SigNASIII delivers testing on up to 128 NAND flash simultaneously. This gives SigNASIII the capability of conducting a wide range of tests on massive numbers of NAND flash in a short period of time. Tests such as acceptance inspection, NAND sorting, reliability evaluation, cycling tests, error cause investigation (data retention, program disturb, read disturb) analysis, access time tests, etc. can be done very quickly.

SigNASIII supports different NAND interfaces, such as SDR, Toggle DDR, Toggle DDR2.0, NV-DDR and NV-DDR2 etc. Also, it has been confirmed to work with all NAND type SLC/MLC/TLC for the latest processes, such as Toshiba 19nm, Micron/Intel 20nm and Samsung 21nm.

Summary

SigNASIII is an easy-to-use NAND analyzer system, suitable for testing massive numbers of NAND (up-to 128) simultaneously. Various tests such as acceptance inspection, operation verification, cycling tests, access time tests, error investigation, error cause analysis and ECC evaluations can be easily done quickly. It can be used for NAND sorting judged by bit error rate/page error rate; tests on bit error caused by data retention, program disturb and read disturb; and error distribution.
SigNASIII is composed of the main-board with FPGA-based NAND controllers, the sub-board(s) where NAND flash for tests is set up, and Windows-based software.

NAND Flash Memory Tester SigNAS3 Summary NAND Flash Memory Tester SigNAS3 Summary

Features

  1. 1. Main-board (Sp3993)
    • - Up-to 8 Sub-boards are connectable
    • - Indicates communicating status of NAND/PC by LED
    NAND Flash Memory Tester SigNAS3 Features 1. Main-board (Sp3993)
    SizeMain-board : 284.5mm x 478.5mm x 51.5mm 
    Sub-board : 279mm x 170mm x 45mm
    Power SupplyAC:90V~264V (DC:15V/40A)
    Power Consumption360W *in case of fully loaded: i.e. 8-sub-boards are used
    Storage temperatureMain-board : -40~125degC
    Sub-board : -40~125degC
    Operating temperatureMain-board : 0~55degC
    Sub-board : -40~100degC
    NAND testing numberup-to 128 *in case of fully loaded: i.e. 8-sub-boards are used
    I/FUSB2.0, USB3.0, Giga Ethernet
  2. 2. Sub-board (Sp3993-x)
    • - Up-to 16 NAND flash could be set-up for each.
    • - Can be connected to main-board by cable with up to 2 meter length
      (standard cable length is 1 meter).
    • - Power supplied by main-board via cable
    • - Power Switch ON/OFF is controlled independently for each sub-board
    • - Power supply of NAND flash can be controlled from PC software.
    Product No.Socket
    Sp3993-1TSOP48
    Sp3993-2BGA132
    Sp3993-3BGA63
    Sp3993-4BGA100
    Sp3993-5BGA152
    Sp3993-6BGA272
    Sp3993-7BGA316
    NAND Flash Memory Tester SigNAS3 Features 2. Sub-board (Sp3993-x)
  3. 3. Testing software
    Testing software enables: (part of features)
    • - Set NAND interface timing
    • - Set NAND device power voltage
    • - Get NAND ID/Status
    • - Bad Block scan/management
    • - Access time test
    • - Access time as the function of P/E cycles
    • - Issue NAND command (Erase Program, Read)
    • - Set program pattern (Increment, Pseudo Random, Page Stripe, etc)
    • - Dump & save read data
    • - P/E Cycles (cycle number, program pattern are programmable)
    • - Support script language (SIGLEAD Script Language; SSL)
    • - Programmable ECC strength
    • - Data retention test (time vs. bit error)
    • - Program disturb test (P/E cycles Vs bit error)
    • - Error distribution (by page/column)

Supported NAND

 ToshibaSamsungMicronHynixSanDisk
SLC>動作可能>動作可能>動作可能>動作可能>動作可能
MLC>動作可能>動作可能>動作可能>動作可能>動作可能
TLC>動作可能>動作可能>動作可能>動作可能>動作可能
3D NAND>動作可能 >動作可能>動作可能>動作可能
Async./SDR>動作可能>動作可能>動作可能>動作可能>動作可能
Sync./Toggle DDR>動作可能>動作可能>動作可能>動作可能>動作可能
RR>動作可能>動作可能>動作可能>動作可能>動作可能
Prosess15nm15nm16nm16nm15nm
 ToshibaSamsungMicron
SLC>動作可能>動作可能>動作可能
MLC>動作可能>動作可能>動作可能
TLC>動作可能>動作可能>動作可能
3D NAND>動作可能 >動作可能
Async./SDR>動作可能>動作可能>動作可能
Sync./Toggle DDR>動作可能>動作可能>動作可能
RR>動作可能>動作可能>動作可能
Prosess15nm15nm16nm
 HynixSanDisk 
SLC>動作可能>動作可能 
MLC>動作可能>動作可能 
TLC>動作可能>動作可能 
3D NAND>動作可能>動作可能 
Async./SDR>動作可能>動作可能 
Sync./Toggle DDR>動作可能>動作可能 
RR>動作可能>動作可能 
Prosess16nm15nm 
  • - ONFI 3.2 / Toggle DDR 2.0 compliance devices (SLC / MLC / TLC)
  • - NAND Interface : SDR (Asynchronous) / NV-DDR (Synchronous) / Toggle DDR
  • - Package : TSOP 48pin, BGA 63pin/100pin/132pin/152pin/272pin/316pin
  • - Confirmed latest NAND: Toshiba 19nm, Micron/Intel 20nm, Samsung 21nm
  • - System adjustment can be done to resolve the case that NAND doesn't work

Technical support

  • - 1 year technical support (via telephone and email)
  • - 1 year free version update/bug-fix of testing software
  • - For support after 1 year since purchase, an extra support contract is needed

Deliverables

Deliverables consist of the following parts. Immediate analysis can be carried out at the date of delivery.

< Main-board set (Sp3980) >
  • - Main-board (Sp3993)
  • - Power unit
  • - Analysis software
  • - NAND controller circuit and firmware
  • - Operational Guide*USB cable and LAN cable are not included
< Sub-board set (Sp3980-x) >
  • - Sub-board (Sp3993-x)
  • - Cable (standard length is 1m, 2m max)

For more information/customization on NAND flash memory tester, please contact us.

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