Slide 1

SSD Controller IC

SL2007

Siglead Inc. is engaged in the R&D of ECC (Error Correcting Code) for SSD (Solid State Drive) and the development of SSD controller LSI. Our controller is designed to support a wide range of NAND flash generations, thereby addressing the short product-cycle associated with improvements to NAND flash memory’s process node. With our SSD controller, it is possible to work towards long-term application. We prepare various line-ups for consumer and industrial application.

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Slide 2

FPGA Board
with High-speed AD/DA

Sp9906

An FPGA board designed for evaluation of high-speed signal processing, such as wireless communication, image processing, etc. By default, it is equipped with Altera FPGA(StratixIV, StratixIII), high-speed ADC/DAC, DVI I/O, Gigabit Ethernet controller.

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Slide 3

NAND Flash Memory Tester

SigNAS3

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Siglead Inc. is a SSD controller provider and a leading company in the R&D of ECC for SSD/NAND flash memory. Based on its strong R&D experience, NAND flash memory testing knowhow and error analysis technology, Siglead is providing its “SigNAS series” NAND flash memory testers to customers. Developed from the viewpoint of NAND flash users, with plenty of additional technical support, these products will definitely meet customers’ demands on various NAND flash testing and evaluations.
Tests such as acceptance inspection, NAND flash sorting, reliability evaluation, cycling tests, error causation investigation (data retention, program disturb, read disturb) analysis, access time tests, etc. can be done very quickly.

Slide 3

Signal Processing IP List

NAND
Flash Memory
Controller

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This NAND flash memory controller supports SLC/MLC/TLC. Two different types are available: host CPU type and AMBA (AXI/AHB/APB) type. The number of NAND interface channels can be customized according to customer's request; hence it's possible to support wide range of read/write speeds.

New Post【Product Guide】

• Evaluation of error P/E cycle dependence2024/07/12
  Last time, we introduced the P/E cycle, and now we will introduce the ability of SigNAS3 to measure the errors that occur in relation to this stress. Program Disturb This is a phenomenon in which the threshold voltage of unselected cells and transistors that share a word line increases due to programming operations.As a result,… Read more: Evaluation of error P/E cycle dependence
• P/E cycle (Rewriting life, Endurance)2024/05/23
  When programming data to NAND flash memory (NAND), the existing data must first be erased. There is a limit to the number of times this series of processes (P/E cycles) can be processed, and if this is exceeded, a failure will occur. There is a limit to the number of times this series of processes… Read more: P/E cycle (Rewriting life, Endurance)
• Protection functions of NAND to be measured2024/04/20
  SigNAS3 has a function that allows you to set specific blocks and pages to execute or not execute Program or Read, or exclude them from evaluation, in order to protect existing data in NAND Flash Memory (NAND) and ensure evaluation quality. Three types of functions are introduced below. Read Only Mode In the same folder… Read more: Protection functions of NAND to be measured

About Siglead

SIGLEAD provides an environment for technicians.

So, technicians meet SIGLEAD requirements

And also, SIGLEAD also provides an even better environment for technicians. ……

This positive spiral is formed and

By becoming an "independent group of engineers"

We believe that we can produce products that satisfy our customers.

CONTACT

Please feel free to ask us.

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RECRUIT

recruitment of hardware engineers

(semiconductor embodiment firmware)

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